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1 |
Epitaxial graphene on SiC for quantum resistance metrology
Kruskopf, Mattias. - Braunschweig : Physikalisch-Technische Bundesanstalt, [2017], [1. Auflage]
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2 |
Line edge roughness in optical critical dimension metrology
Bilski, Bartosz. - Stuttgart : Institut für Technische Optik der Universität Stuttgart, 2016
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3 |
High-accuracy optical clock based oh the octupole transition in 171Yb+
Huntemann, Nils. - Braunschweig : Physikalisch-Technische Bundesanstalt, August 2015
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4 |
Learning comprehensible models for analysis and predictions in scientific databases
Zimmer, Anca M.. - Aachen : Apprimus-Verl., 2014, 1. Aufl.
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5 |
Aus Fehlern wird man klug
Heinicke, Susanne. - Berlin : Logos-Verl., 2012
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6 |
Development of a double-ended gauge block interferometer for measurement of the absolute length
Abdelnaser, Amany Abdelaty Mohammed, 2012
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7 |
Symmetrieabhängige Frequenzverschiebungen in Atomuhren
Will, Johannes, 2012
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8 |
An experimental test of Newton's law of gravitation for small accelerations
Schubert, Sven. - Hamburg : DESY, 2011
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9 |
A new spectrometer to measure the molar Planck constant
Krempel, Jochen, 2010
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10 |
Contributions to a Yb+ single-ion optical frequency standard
Stein, Björn, 2010
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