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1 |
Atomic force microscope (AFM) cantilevers as encoder for real-time displacement measurements Chen, Xiaomei. - Berlin : mbv, Mensch-und-Buch-Verl., 2011
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2 |
Beiträge zur Entwicklung neuer physikalisch-chemischer Messinstrumente Wudy, Franz, 2009, [Online-Ausg.]
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3 |
Beiträge zur Entwicklung neuer physikalisch-chemischer Messinstrumente Wudy, Franz, 2009
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Two new installations for non-destructive sample analysis: PIXE and PGAA Kudějová, Petra, 2005
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Two new installations for non-destructive sample analysis: PIXE and PGAA Kudějová, Petra, 2005
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