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Ergebnis der Suche nach: tit all "Low Temperature Scanning Probe Microscopy"
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	1	A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy Enthalten in Beilstein journal of nanotechnology Bd. 13: 1120-1140
	2	(11) Anthrahelicene on InSb (001) c (8×2): A Low‐Temperature Scanning Probe Microscopy Study Enthalten in ChemPhysChem Bd. 11, 2010, Nr. 16: 3522-3528. 7 S.
	3	ChemInform Abstract: Single‐Molecule Chemistry and Physics Explored by Low‐Temperature Scanning Probe Microscopy Enthalten in ChemInform Bd. 42, 2011, Nr. 45: no-no. 1 S.
	4	Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy Enthalten in Nanoscale research letters Bd. 13, 8.5.2018, Nr. 1, date:12.2018: 1-11

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