Katalog der Deutschen Nationalbibliothek

Ergebnis der Suche nach: tit all "Low Temperature Scanning Probe Microscopy"
im Bestand: Gesamter Bestand

1 - 3 von 3

	1	A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy Enthalten in Beilstein journal of nanotechnology Bd. 13: 1120-1140
	2	Development of Low-Temperature Photon Scanning Probe Microscopy and Nanoscale Characterization of Ultrathin ZnO Layers on Ag(111) Liu, Shuyi. - Berlin : Freie Universität Berlin, 2019
	3	Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy Enthalten in Nanoscale research letters Bd. 13, 8.5.2018, Nr. 1, date:12.2018: 1-11