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| Link zu diesem Datensatz | https://d-nb.info/1366604555 |
| Art des Inhalts | Konferenzschrift |
| Titel | Computer Vision – ECCV 2024 Workshops : Milan, Italy, September 29–October 4, 2024, Proceedings, Part IV / edited by Alessio Del Bue, Cristian Canton, Jordi Pont-Tuset, Tatiana Tommasi |
| Person(en) |
Del Bue, Alessio (Herausgeber) Canton, Cristian (Herausgeber) Pont-Tuset, Jordi (Herausgeber) Tommasi, Tatiana (Herausgeber) |
| Organisation(en) | SpringerLink (Online service) (Sonstige) |
| Ausgabe | 1st ed. 2025 |
| Verlag | Cham : Springer Nature Switzerland, Imprint: Springer |
| Zeitliche Einordnung | Erscheinungsdatum: 2025 |
| Umfang/Format | Online-Ressource, LV, 462 p. 155 illus., 143 illus. in color. : online resource. |
| Andere Ausgabe(n) |
Printed edition:: ISBN: 978-3-031-92804-8 Printed edition:: ISBN: 978-3-031-92806-2 |
| Inhalt | -- On the Application of Egocentric Computer Vision to Industrial Inspection. -- NeuroSymbolic Visual Transform based on Logic Tensor Network for Defect Detection. -- Multimodal computer vision techniques for wooden utility pole density esti mation with contact-free sensing. -- Dynamic Label Injection for Imbalanced Industrial Defect Segmentation. -- XAI-guided Insulator Anomaly Detection for Imbalanced Datasets. -- Exploring Multi-modal Neural Scene Representations With Applications on Thermal Imaging. -- Foreground-Aware Knowledge Distillation for Enhanced Damage Detection. -- AnomalyFactory: Regard Anomaly Generation as Unsupervised Anomaly Localization. -- Interactive Explainable Anomaly Detection for Industrial Settings. -- DAS3D: Dual-modality Anomaly Synthesis for 3D Anomaly Detection. -- SQUAD: Scalar Quantized representation learning for Unsupervised Anomaly Detection and localization. -- Deep Unsupervised Segmentation of Log Point Clouds. -- A Computer Vision System for Automatic Edge Detection of Magnetic Grain Profile. -- Find the Assembly Mistakes: Error Segmentation for Industrial Applications. -- EM Based Nano-Scale Defect Analysis in Semiconductor Man ufacturing for Advanced IC Nodes. -- On The Relationship between Visual Anomaly-free and Anomalous Representations. -- DIE-VIS: an Automated Visual Inspection System for Cardboard Box Manufacturing. -- When the Small-Loss Trick is Not Enough: Multi-Label Image Classification with Noisy Labels Applied to CCTV Sewer Inspections. -- AnomalousPatchCore: Exploring the Use of Anomalous Samples in Industrial Anomaly Detection. -- Self-supervised Models are Strong Industrial Few-shot Classification Learners. -- Hyperspectral Imaging and Computer Vision Based Remote Monitoring of SO2 Emissions in Maritime Vessels. -- Temporal-consistent CAMs for Weakly Supervised Video Segmentation in Waste Sorting. -- Sequential PatchCore: Anomaly Detection for Surface Inspection using Synthetic Impurities. -- SplatPose+: Real Time Image-Based Pose-Agnostic 3D Anomaly Detection. -- BBD-Polyp: Weakly Supervised Polyp Segmentation via Bounding Box and Depth Map. -- ENSTRECT: A Stage-based Approach to 2.5D Structural Damage Detection. -- An Augmentation-based Model Re-adaptation Framework for Robust Image Segmentation. -- Meta Learning-Driven Iterative Refinement for Robust Anomaly Detection in Industrial Inspection |
| Persistent Identifier |
URN: urn:nbn:de:101:1-2505240414427.724909004935 DOI: 10.1007/978-3-031-92805-5 |
| URL | https://doi.org/10.1007/978-3-031-92805-5 |
| ISBN/Einband/Preis | 978-3-031-92805-5 |
| Sprache(n) | Englisch (eng) |
| Beziehungen | Lecture Notes in Computer Science ; 15626 |
| DDC-Notation | 006.37 (maschinell ermittelte DDC-Kurznotation) |
| Sachgruppe(n) | 004 Informatik |
| Online-Zugriff | Archivobjekt öffnen |
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