Katalog der Deutschen Nationalbibliothek

Neuigkeiten Servicezeiten in Frankfurt am Main ab 1. Dezember 2025: Montag bis Freitag 9–18 Uhr und Samstag 10–16 Uhr
Service hours in Frankfurt am Main from 1 December 2025: Monday to Friday 9:00-18:00 and Saturday 10:00-16:00
 
 
 


Ergebnis der Suche nach: tit all "Pattern Recognition"
im Bestand: Gesamter Bestand

231 - 240 von 2580
<< < > >>


Artikel 231 Improving Statistical Projections of Ocean Dynamic Sea-level Change Using Pattern Recognition Techniques
Enthalten in EGUsphere 02.12.2022: 1-31. 31 S.
Online Ressource
Artikel 232 Retraction Note: Research on the intelligent judgment of traffic congestion in intelligent traffic based on pattern recognition technology
Enthalten in Cluster computing 1.12.2022: 1
Online Ressource
Artikel 233 On the learning of vague languages for syntactic pattern recognition
Enthalten in Pattern analysis and applications 23.11.2022: 1-11
Online Ressource
Artikel 234 Exploring pattern recognition: what is the relationship between the recognition of words, faces and other objects?
Enthalten in Cognitive processing 14.11.2022: 1-12
Online Ressource
Artikel 235 Myocardial Perfusion SPECT Imaging Radiomic Features and Machine Learning Algorithms for Cardiac Contractile Pattern Recognition
Enthalten in Journal of digital imaging 14.11.2022: 1-13
Online Ressource
Artikel 236 Intrusion Detection System Based on Pattern Recognition
Enthalten in The Arabian journal for science and engineering 7.11.2022: 1-9
Online Ressource
Artikel 237 Crack Pattern Recognition Based on Acoustic Emission Waveform Features
Enthalten in Rock mechanics and rock engineering 30.10.2022: 1-14
Online Ressource
Artikel 238 Gas Sensor Array with Pattern Recognition Algorithms for Highly Sensitive and Selective Discrimination of Trimethylamine
Enthalten in Advanced intelligent systems 17.10.2022. 10 S.
Online Ressource
Artikel 239 Diffusive Memristors with Uniform and Tunable Relaxation Time for Spike Generation in Event‐Based Pattern Recognition
Enthalten in Advanced materials 07.10.2022. 7 S.
Online Ressource
Artikel 240 CNN and ensemble learning based wafer map failure pattern recognition based on local property based features
Enthalten in Journal of intelligent manufacturing 28.9.2022: 1-23
Online Ressource


231 - 240 von 2580
<< < > >>


E-Mail-IconAdministration