Katalog der Deutschen Nationalbibliothek

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Servicezeiten in Frankfurt am Main ab 1. Dezember 2025: Montag bis Freitag 9–18 Uhr und Samstag 10–16 Uhr
Service hours in Frankfurt am Main from 1 December 2025: Monday to Friday 9:00-18:00 and Saturday 10:00-16:00

Dienstag 9. Dezember 2025: Die Lesesäle der Deutschen Nationalbibliothek in Leipzig öffnen wegen einer Personalversammlung erst ab 13 Uhr. // Tuesday 9 December 2025: The reading rooms of the German National Library in Leipzig will open at 13:00 due to a staff assembly.

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30861 - 30870 von 30884

	30861	‘Worth the test?’ Pragmatism, pill testing and drug policy in Australia Enthalten in Harm reduction journal Bd. 15, 10.4.2018, Nr. 1, date:12.2018: 1-13
	30862	Writing assessment literacy and its impact on the learning of writing: A netnography focusing on Duolingo English Test examinees Enthalten in Language testing in Asia Bd. 14, 8.7.2024, Nr. 1, date:12.2024: 1-19
	30863	Wuerth Elektronik Concentrates Engineering and Test in Munich Enthalten in ATZelectronics worldwide Bd. 18, 6.10.2023, Nr. 10, date:10.2023: 56-57
	30864	X-chromosome genetic association test incorporating X-chromosome inactivation and imprinting effects Enthalten in Journal of genetics Bd. 98, 4.11.2019, Nr. 4, date:11.2019: 1-12
	30865	X-ray CT analysis of the evolution of ballast grain morphology along a Micro-Deval test: key role of the asperity scale Enthalten in Granular matter Bd. 21, 13.3.2019, Nr. 2, date:5.2019: 1-12
	30866	XGBoost-based machine learning test improves the accuracy of hemorrhage prediction among geriatric patients with long-term administration of rivaroxaban Enthalten in BMC geriatrics Bd. 23, 10.7.2023, Nr. 1, date:12.2023: 1-12
	30867	XTT assay of ex vivo saliva biofilms to test antimicrobial influences Enthalten in GMS Krankenhaushygiene interdisziplinär Bd. 7, 04.04.2012, Nr. 1
	30868	Yes, we can use it: a formal test on the accuracy of low-pass nanopore long-read sequencing for mitophylogenomics and barcoding research using the Caribbean spiny lobster Panulirus argus Enthalten in BMC genomics Bd. 21, 9.12.2020, Nr. 1, date:12.2020: 1-16
	30869	Yield improvement planning for the recycle processes of test wafers Enthalten in The international journal of advanced manufacturing technology Bd. 27, 16.3.2005, Nr. 11-12, date:2.2006: 1228-1234
	30870	Yield Strengths of Biaxially Textured Metallic Substrates (Ni and its Alloys) Determined Using a Simplified Test Method Enthalten in Journal of electronic materials Bd. 36, 14.9.2007, Nr. 10, date:10.2007: 1265-1269

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