|
371 |
An algorithm for indoor positioning based on LightGBM + ExtraTrees chaotic weighted ensemble: evaluation and comparison
Enthalten in The journal of supercomputing Bd. 81, 2.5.2025, Nr. 7, date:5.2025: 1-31
|
|
|
|
372 |
An Alternative Algorithm to FFT for the Numerical Evaluation of Stokes's Integral
Enthalten in Studia geophysica et geodaetica Bd. 44, 1.7.2000, Nr. 3, date:7.2000: 374-380
|
|
|
|
373 |
An Asymptotically Optimal Algorithm for the Search for and Evaluation of the Slichter Mode from Long-Term Strain Data
Enthalten in Moskovskij gosudarstvennyj universitet im. M.V. Lomonosova: Moscow University physics bulletin Bd. 74, 11.6.2019, Nr. 2, date:3.2019: 205-211
|
|
|
|
374 |
An efficient algorithm for the evaluation of inclination and eccentricity functions
Enthalten in Manuscripta geodaetica Bd. 12, 16.10.2024, Nr. 1, date:3.1987: 11-15
|
|
|
|
375 |
An efficient multi-predictor reversible data hiding algorithm based on performance evaluation of different prediction schemes
Enthalten in Multimedia tools and applications Bd. 76, 7.1.2016, Nr. 2, date:1.2017: 2131-2157
|
|
|
|
376 |
An Egyptian study to assess the accuracy and reliability of CAD-RADS CT coronary angiography algorithm in the evaluation of coronary artery disease
Enthalten in The Egyptian Journal of Radiology and Nuclear Medicine Bd. 53, 1.2.2022, Nr. 1, date:12.2022: 1-12
|
|
|
|
377 |
An evaluation and query algorithm for the influence of spatial location based on RkNN
Enthalten in Frontiers of computer science Bd. 15, 4.12.2020, Nr. 2, date:4.2021: 1-9
|
|
|
|
378 |
An Evaluation Model of Supply Chain Performances Using 5DBSC and LMBP Neural Network Algorithm
Enthalten in Journal of bionic engineering Bd. 10, 1.9.2013, Nr. 3, date:9.2013: 383-395
|
|
|
|
379 |
An Evaluation of an Algorithm for the Selection of Flexible Survival Models for Cancer Immunotherapies: Pass or Fail?
Enthalten in PharmacoEconomics Bd. 42, 20.9.2024, Nr. 12, date:12.2024: 1395-1412
|
|
|
|
380 |
An Evaluation of an Automated Detection Algorithm to Count Defects Present in X-Ray Topographical Images of SiC Wafers
Enthalten in Materials Research Society: MRS online proceedings library Bd. 994, 1.2.2011, Nr. 1, date:12.2006: 1-6
|
|
Administration
