Katalog der Deutschen Nationalbibliothek

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Servicezeiten in Frankfurt am Main ab 1. Dezember 2025: Montag bis Freitag 9–18 Uhr und Samstag 10–16 Uhr
Service hours in Frankfurt am Main from 1 December 2025: Monday to Friday 9:00-18:00 and Saturday 10:00-16:00

Dienstag 9. Dezember 2025: Die Lesesäle der Deutschen Nationalbibliothek in Leipzig öffnen wegen einer Personalversammlung erst ab 13 Uhr. // Tuesday 9 December 2025: The reading rooms of the German National Library in Leipzig will open at 13:00 due to a staff assembly.

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84071 - 84080 von 84125

	84071	YOLO-Mamba: object detection method for infrared aerial images Enthalten in Signal, image and video processing Bd. 18, 17.8.2024, Nr. 12, date:12.2024: 8793-8803
	84072	YOLO-ME: an enhanced lightweight YOLOv7 Tiny model for efficient object detection in aerial imagery Enthalten in Signal, image and video processing Bd. 19, 21.2.2025, Nr. 4, date:4.2025: 1-12
	84073	YOLO-MTG: a lightweight YOLO model for multi-target garbage detection Enthalten in Signal, image and video processing Bd. 18, 20.5.2024, Nr. 6-7, date:8.2024: 5121-5136
	84074	YOLO-R:road damage detector based on dynamic receptive fields and lightweight design Enthalten in Signal, image and video processing Bd. 19, 18.7.2025, Nr. 11, date:11.2025: 1-9
	84075	YOLOSAM: A unified and efficient anomaly detection model based on auto mask prompt Enthalten in Signal, image and video processing Bd. 19, 9.9.2025, Nr. 12, date:12.2025: 1-9
	84076	YOLOv10-CBRC: A high-precision document image layout analysis model Enthalten in Ǧāmiʿat al-Malik Saʿūd: Journal of King Saud University / Computer and information sciences Bd. 37, 31.7.2025, Nr. 6, date:8.2025: 1-21
	84077	YOLOv11-PSP: an efficient lightweight instrument detection method for substation applications Enthalten in Signal, image and video processing Bd. 19, 9.9.2025, Nr. 12, date:12.2025: 1-11
	84078	Yolov3-Pruning(transfer): real-time object detection algorithm based on transfer learning Enthalten in Journal of real-time image processing Bd. 19, 14.6.2022, Nr. 4, date:8.2022: 839-852
	84079	YOLOv4-Based Semiconductor Wafer Notch Detection Using Deep Learning and Image Enhancement Algorithms Enthalten in International journal of precision engineering and manufacturing Bd. 25, 16.8.2024, Nr. 9, date:9.2024: 1909-1916
	84080	YOLOv5-S-G-B: a lightweight intelligent detection model for cardboard surface defects Enthalten in Signal, image and video processing Bd. 18, 27.6.2024, Nr. 10, date:9.2024: 6997-7011

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