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An Introduction to Finite Tight Frames Waldron, Shayne F. D.. - New York, NY : Springer New York, 2018, 1st edition 2018
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An Introduction to Frames and Riesz Bases Christensen, Ole. - Cham : Springer International Publishing, 2016, 2nd ed. 2016
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An Introduction to Numerical Methods and Analysis Epperson, James F.. - New York, NY : John Wiley & Sons, 2014, 2., Auflage
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Solutions Manual to Accompany An Introduction to Numerical Methods and Analysis Epperson, James F.. - New York, NY : John Wiley & Sons, 2014, 2., Auflage
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Solutions Manual to Accompany An Introduction to Numerical Methods and Analysis Epperson, James F.. - New York, NY : John Wiley & Sons, 2014, 2., Auflage
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An Introduction to Numerical Methods and Analysis Epperson, James F.. - New York, NY : John Wiley & Sons, 2013, 2., Auflage
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An Introduction to Numerical Methods and Analysis, Revised Edition Epperson, James F.. - New York, NY : John Wiley & Sons, 2013, 1., Auflage
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Mercier, B., An Introduction to the Numerical Analysis of Spectral Methods, Berlin etc., Springer‐Verlag 1989, V. 154 pp., DM 39,–. ISBN 3‐540‐51106‐7 (Lecture Notes in Physics 318) Enthalten in ZAMM Bd. 71, 2006, Nr. 7‐8: 232-232. 1 S.
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Glashoff, K./Gustafson, S.‐A., Linear Optimization and Approximation. An Introduction to the Theoretical analysis and Numerical Treatment of Semi‐Infinite Programs. Berlin‐Heidelberg‐New York, Springer‐Verlag 1983. IX, 197 S., 20 Abb., DM 48,—. US $ 20.70. ISBN 3‐540‐90857‐9 (Applied Mathematical Sciences 45) Enthalten in ZAMM Bd. 64, 2006, Nr. 9: 406-406. 1 S.
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Miller, J. J. H. (ed.), An Introduction to the Numerical Analysis of Semiconductor Devices and Integrated Circuits. Lecture Notes of Short Course held in Association with NASECODE II Conference. VIII, 75 S., US $ 32.00. ISBN 0‐906783‐04‐6 £ Browne, B. T./Miller, J. J. H. (eds.), Numerical Analysis of Semiconductor Devices and Integrated Circuits. Proceedings of the NASECODE II Conference, Dublin, June 1981. Dublin, Boole Press 1981. XIII, 288 S., US $ 69.00. ISBN 0906 783‐03‐8 Enthalten in ZAMM Bd. 62, 2006, Nr. 9: 498-498. 1 S.
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