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	100001	Post-Processing of Random Number Generator in InGaAs Contact Photodiode Homodyne Circuit Based on Continuous Wavelet Transform to Improve NIST Longest Run Test Pass Rate Enthalten in Russian microelectronics Bd. 52, 21.3.2024, Nr. 1, date:12.2023: S332-S336
	100002	Post-selection Inference in Multiverse Analysis (PIMA): An Inferential Framework Based on the Sign Flipping Score Test Enthalten in Psychometrika Bd. 89, 25.4.2024, Nr. 2, date:6.2024: 542-568
	100003	Post-test Enthalten in Facial plastic surgery Bd. 28, 2012, Nr. 04: C1-C2
	100004	Post-Test Enthalten in Facial plastic surgery Bd. 29, 2013, Nr. 01: C1-C2
	100005	Post-test Enthalten in Facial plastic surgery Bd. 28, 2012, Nr. 05: C1-C4
	100006	Post-test Enthalten in Facial plastic surgery Bd. 28, 2012, Nr. 06: C1-C2
	100007	Post-test Probability According to Prevalence Enthalten in Journal of general internal medicine Bd. 26, 6.7.2011, Nr. 10, date:10.2011: 1091
	100008	Post-test Probability According to Prevalence Enthalten in Journal of general internal medicine Bd. 26, 13.7.2011, Nr. 10, date:10.2011: 1090
	100009	Post-test probability for neonatal hyperbilirubinemia based on umbilical cord blood bilirubin, direct antiglobulin test, and ABO compatibility results Enthalten in Zeitschrift für Kinderheilkunde Bd. 175, 19.1.2016, Nr. 5, date:5.2016: 651-657
	100010	Post-Test Questions Enthalten in CNS drugs Bd. 23, 29.8.2012, Nr. 1, date:11.2009: 51

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