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141 |
High-resolution microscopy with photoswitchable organic markers Fölling, Jonas, 2008, [Online-Ausg.]
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142 |
Hochauflösende multispektrale Fluoreszenzmikroskopie mit lateralen stehenden Wellen Amberger, Roman, 2008
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143 |
Hochdurchsatzverfahren zur Entdeckung neuer piezoelektrischer Materialien mittels der Ultraschall-Kraftmikroskopie Rende, Daniela, 2008
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144 |
Magnetic field microscopy using ultracold atoms Aigner, Simon, [2008]
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145 |
Nanoscale imaging of mechanical properties of polymeric materials using nanotomography and scanning force microscopy based methods Dietz, Christian, 2008
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146 |
Nanotribological surface characterization by frequency modulated torsional resonance mode AFM Yurtsever, Ayhan, 2008
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147 |
Near-field infrared nanoscopy applied to laterally structured self-assembled monolayers Kopf, Ilona, 2008
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148 |
Near-field microscopy Samson, Jean-Sébastien, 2008
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149 |
Precision measurements with SMI and 4Pi Microscopy Baddeley, David, [2008]
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150 |
Registration and quantitative image analysis of SPM data Rehse, Sabine, 2008
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