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Donnerstag, 11. September 2025: Die Deutsche Nationalbibliothek öffnet wegen eines Beschäftigtentreffens an beiden Standorten erst um 15 Uhr. // Thursday, 11 September 2025: The German National Library will not open until 15:00 due to a staff meeting at both locations.

Ergebnis der Suche nach: "Machine Learning"
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	1521	Optimization of Cooling Jacket Geometry Based on Numerical Modeling and Machine Learning Algorithms Enthalten in International journal of automotive technology 27.1.2025: 1-15
	1522	Predicting the thermal performance of a rectangular channel with asymmetric protrusion surfaces using machine learning algorithms Enthalten in Journal of thermal analysis and calorimetry 27.1.2025: 1-16
	1523	Prediction of surgical necessity in children with ureteropelvic junction obstruction using machine learning Enthalten in Irish journal of medical science 27.1.2025: 1-8
	1524	Untethered Autonomous Holonomic Mobile Micromanipulator for Operations in Isolated Confined Spaces Enthalten in Advanced intelligent systems 26.01.2025. 9 S.
	1525	A Case Study on the DTC Prediction of Commercial Vehicles Using Machine Learning Approach Enthalten in International journal of automotive technology 26.1.2025: 1-15
	1526	A holochain-based IoT-enabled agri-food traceability system: application in the recombined milk supply chain Enthalten in International journal of information technology 26.1.2025: 1-17
	1527	Assessment of online teaching in higher education systems during pre-post COVID-19 using fuzzy techniques Enthalten in International journal of information technology 26.1.2025: 1-11
	1528	Development and Validation of Intelligent Models for Predicting Rockburst Location Based on Microseismic Monitoring and Machine Learning Enthalten in Rock mechanics and rock engineering 26.1.2025: 1-21
	1529	A hybrid machine learning-based decision-making model for viable supplier selection problem considering circular economy dimensions Enthalten in Environment, development and sustainability 25.1.2025: 1-33
	1530	Observational and experimental insights into machine learning-based defect classification in wafers Enthalten in Journal of intelligent manufacturing 25.1.2025: 1-51

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