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	99771	Possible experimental test of the wave packet collapse Enthalten in Società italiana di fisica: Il nuovo cimento / Lettere al nuovo cimento Bd. 39, 7.1.2008, Nr. 11, date:3.1984: 225-233
	99772	Possible pathomechanism behind the transient hypofunction of the affected canal in BPPV. Letter to the editor regarding “Clinical significance of video head impulse test in benign paroxysmal positional vertigo: a meta-analysis” by Elsherif M et al. European Archives of Oto-Rhino-Laryngology (2021);278(12):4645–4651 Enthalten in European archives of oto-rhino-laryngology and head & neck Bd. 279, 27.11.2021, Nr. 2, date:2.2022: 1117-1118
	99773	Possible test for the /ΔI/=0 weak nuclear force Enthalten in Il nuovo cimento / A Bd. 44, 5.1.2016, Nr. 1, date:7.1966: 218-221
	99774	Possible test of local Lorentz invariance from τ decays Enthalten in Zeitschrift für Physik / C / Particles and fields Bd. 73, 31.3.2014, Nr. 3, date:9.1997: 465-468
	99775	Possible test ofCP violation and the /ΔT/ = 1/2 rule for radiative K-meson decays Enthalten in Il nuovo cimento Bd. 36, 12.11.2007, Nr. 3, date:4.1965: 1055-1058
	99776	Post-cycling Interface Strength Test of Geogrids Enthalten in International journal of civil engineering Bd. 18, 30.4.2020, Nr. 7, date:7.2020: 827-834
	99777	Post-exercise gastric emptying of carbohydrate solutions determined using the 13C acetate breath test Enthalten in European journal of applied physiology Bd. 71, 1.9.1995, Nr. 4, date:9.1995: 306-310
	99778	Post-exposure rate of tuberculosis infection among health care workers measured with tuberculin skin test conversion after unprotected exposure to patients with pulmonary tuberculosis: 6-year experience in an Italian teaching hospital Enthalten in BMC infectious diseases Bd. 14, 12.6.2014, Nr. 1, date:12.2014: 1-7
	99779	Post-Hoc Tests in One-Way ANOVA: The Case for Normal Distribution Enthalten in Methodology Bd. 20, 28.06.2024, Nr. 2
	99780	Post-Processing of Random Number Generator in InGaAs Contact Photodiode Homodyne Circuit Based on Continuous Wavelet Transform to Improve NIST Longest Run Test Pass Rate Enthalten in Russian microelectronics Bd. 52, 21.3.2024, Nr. 1, date:12.2023: S332-S336

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